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A two-dimensional surface profile is obtained over a sampling length by using a contact type stylus profilometer as shown in the figure below. A line AA parallel to the general lay of the trace is considered. The true heights from AA to the peaks and valleys (in $\mu \mathrm{m}$ ) in the trace are also shown in the figure (not to scale).

The ten-point height average in $\mu \mathrm{m}$ is

  1. $4.57$
  2. $5.99$
  3. $3.09$
  4. $2.90$

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